Device-Aware-Test (DAT) is a breakthrough testing technology that empowers the semiconductor industry to win the war against unmodeled faults. Going beyond traditional Cell-Aware Test, DAT directly integrates the true electrical behavior of physical defects rather than approximating them as simple resistors. The result is a precise representation of real defect mechanisms, bridging the long-standing gap between physical defects and fault models.

Proven through industrial case studies on STT-MRAM, RRAM, and FeFET, DAT detects unique faults that conventional methods miss, delivering measurable gains in yield, quality, and time-to-market.

By enabling accurate defect diagnosis, faster yield learning, and reduced test time, DAT helps semiconductor manufacturers and EDA partners optimize production, lower costs, and boost reliability from the earliest design stages to high-volume manufacturing.

DAT isn’t just another test innovation — it’s a strategic enabler for the next generation of reliable, efficient, and competitive semiconductor devices.