POPCORN at IEEE ITC: Bringing Device-Aware Test Closer to Industry
How can semiconductor manufacturers detect defects that conventional tests miss? This question took centre stage as Prof. Said Hamdioui and his team presented a tutorial…
POPCORN at ETS 2026: Advancing Device-Aware Testing for Reliable Semiconductor Technologies
The POPCORN project was represented at the European Test Symposium (ETS 2026), a leading European forum bringing together researchers, industry experts, and technology innovators to…