POPCORN at IEEE ITC: Bringing Device-Aware Test Closer to Industry

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How can semiconductor manufacturers detect defects that conventional tests miss? This question took centre stage as Prof. Said Hamdioui and his team presented a tutorial on Device-Aware Test (DAT) at the IEEE International Test Conference (ITC) in San Antonio, USA. Bringing together participants from academia and industry, the tutorial demonstrated how linking physical defect behaviour …

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POPCORN at ETS 2026: Advancing Device-Aware Testing for Reliable Semiconductor Technologies

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The POPCORN project was represented at the European Test Symposium (ETS 2026), a leading European forum bringing together researchers, industry experts, and technology innovators to discuss the latest advances and challenges in electronic testing, reliability, and semiconductor technologies. As part of the symposium, Prof. Said Hamdioui delivered a presentation entitled “Device-Aware-Test: A Means to Attack …

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